Test Circuit for Open Lead Detection of CMOS ICs Based on Supply Current
نویسندگان
چکیده
In this paper, a test circuit is proposed for detecting open leads of CMOS logic ICs by means of supply current of a circuit under test. The circuit consists of a supply current measurement circuit and a test stimulus generator. The test stimulus generator is designed so that high speed test can be realized. Also, it is shown by some experiments that open leads of CMOS ICs will be detected at test speed of 1MHz with the test circuit.
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